On the determination of refractive index and thickness of thin dielectric films from measurement of transmittance

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dc.contributor.authorZaheer Hussain Shah
dc.contributor.authorImtiaz Ahmad
dc.contributor.authorQ. A. Tahir
dc.contributor.authorEhsan Ellahi Khawaja
dc.date.accessioned2012-11-08T09:25:59Z
dc.date.available2012-11-08T09:25:59Z
dc.date.issued2012
dc.description.abstractRefractive index and thickness of a transparent ¯lm (ZnS) on a transparent substrate (BK-7 glass) have been determined from measurement of normal incidence transmittance, using di®erent methods. Some of the methods considered here are most widely used, as is apparent from the literature. The outcome of this study could help a researcher in selecting an appropriate method for such an application. The values of the refractive indices determined by di®erent methods were found to be close to each other (within 0.5%). However, large (up to 4.4%) di®erences existed in the values of the thickness determined by di®erent methods.en_US
dc.identifier.citationSurface Review and Letters, Vol. 19, No. 6 (2012) 1250059en_US
dc.identifier.other10.1142/S0218625X1250059X
dc.identifier.urihttps://escholar.umt.edu.pk/handle/123456789/639
dc.language.isoenen_US
dc.publisherWorld Scientific Publishing Companyen_US
dc.subjectOptical Constantsen_US
dc.subjectThin Filmsen_US
dc.subjectTransparent Substrateen_US
dc.subjectRefractive Indicesen_US
dc.titleOn the determination of refractive index and thickness of thin dielectric films from measurement of transmittanceen_US
dc.typeArticleen_US
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