On the determination of refractive index and thickness of thin dielectric films from measurement of transmittance
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Date
2012
Journal Title
Journal ISSN
Volume Title
Publisher
World Scientific Publishing Company
Abstract
Refractive index and thickness of a transparent ¯lm (ZnS) on a transparent substrate (BK-7 glass)
have been determined from measurement of normal incidence transmittance, using di®erent
methods. Some of the methods considered here are most widely used, as is apparent from the
literature. The outcome of this study could help a researcher in selecting an appropriate method for
such an application. The values of the refractive indices determined by di®erent methods were found
to be close to each other (within 0.5%). However, large (up to 4.4%) di®erences existed in the values
of the thickness determined by di®erent methods.
Description
Keywords
Optical Constants, Thin Films, Transparent Substrate, Refractive Indices
Citation
Surface Review and Letters, Vol. 19, No. 6 (2012) 1250059