Zaheer Hussain ShahImtiaz AhmadQ. A. TahirEhsan Ellahi Khawaja2012-11-082012-11-082012Surface Review and Letters, Vol. 19, No. 6 (2012) 125005910.1142/S0218625X1250059Xhttps://escholar.umt.edu.pk/handle/123456789/639Refractive index and thickness of a transparent ¯lm (ZnS) on a transparent substrate (BK-7 glass) have been determined from measurement of normal incidence transmittance, using di®erent methods. Some of the methods considered here are most widely used, as is apparent from the literature. The outcome of this study could help a researcher in selecting an appropriate method for such an application. The values of the refractive indices determined by di®erent methods were found to be close to each other (within 0.5%). However, large (up to 4.4%) di®erences existed in the values of the thickness determined by di®erent methods.enOptical ConstantsThin FilmsTransparent SubstrateRefractive IndicesOn the determination of refractive index and thickness of thin dielectric films from measurement of transmittanceArticle